2024-10-24 |
NXGWTYOCPS39205 |
MICRON MEMORY JAPAN K K HIROSHIMA |
17738.0 kg |
903083
|
OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS |
2024-10-07 |
NXGWTYOCPA12834 |
MICRON MEMORY JAPAN K K HIROSHIMA |
17738.0 kg |
903083
|
OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS OSCILLOSCOPES, SPECTRUM ANALYSERS AND OTHER INSTRUMENTS AND APPARATUS FOR MEASURING OR CHECKING ELECTRICAL QUANTITIES, EXCLUDING METERS |
2024-02-13 |
KLLMNYC202312001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
1600.0 kg |
|
CHILLER ATS DEX-20A LONWORKS INV NO: 1826442 PO# 4513395030 |
2022-06-12 |
KLLMNYC202205001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
19998.0 kg |
846610
|
C1D TESTER 1238509 PROBER TOOL ID:FD8(10-3TEL_PRECIO_WLR) C1D TESTER 1172758 PROBER TOOL ID:F34SASA300 C1D TESTER 1172755 PROBER TOOL ID:F23SASA3EX C1D TESTER 1278167 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238511 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238509 PROBER TOOL ID:FD8(10-3TEL_PRECIO_WLR) C1D TESTER 1172758 PROBER TOOL ID:F34SASA300 C1D TESTER 1172755 PROBER TOOL ID:F23SASA3EX C1D TESTER 1278167 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238511 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238509 PROBER TOOL ID:FD8(10-3TEL_PRECIO_WLR) C1D TESTER 1172758 PROBER TOOL ID:F34SASA300 C1D TESTER 1172755 PROBER TOOL ID:F23SASA3EX C1D TESTER 1278167 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) C1D TESTER 1238511 PROBER TOOL ID:FD7(10-3TEL_PRECIO_WLR) |
2022-01-28 |
KLLMNYC202201001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
8234.0 kg |
290715
|
001 TEL DIFFUSION INDY B TOOL 001 TEL DIFFUSION INDY B TOOL |
2022-01-23 |
KLLMJP1085627 |
MICRON MEMORY JAPAN G K |
2320.0 kg |
|
001 DUALBEAM-HELIOS NANOLAB 460F1 . . |
2021-12-15 |
KLLMNYC202111002 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
9720.0 kg |
551431
|
DIFF HIKE_Q2LN_PLY_01BCD MICAP# 1216012 INV NO: 1563163 PO# 4510246741 DIFF HIKE_Q2LN_PLY_01BCD MICAP# 1216012 INV NO: 1563163 PO# 4510246741 DIFF HIKE_Q2LN_PLY_01BCD MICAP# 1216012 INV NO: 1563163 PO# 4510246741 |
2021-12-13 |
KLLMNYC202111001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
8756.0 kg |
293627
|
ACCRETECH PROBER UF3000 MT72-C MSIG TESTER WLR 6PIN 1172757 ACCRETECH PROBER UF3000EX C1D MSIG TESTER W;R 6PIN 1082601 MICAP# 11727771, 1172757, 1139324, 1154899 INV NO: 1563715 PO# 4508900124 ACCRETECH PROBER UF3000 MT72-C MSIG TESTER WLR 6PIN 1172757 ACCRETECH PROBER UF3000EX C1D MSIG TESTER W;R 6PIN 1082601 MICAP# 11727771, 1172757, 1139324, 1154899 INV NO: 1563715 PO# 4508900124 |
2021-11-21 |
KLLMJP1082138 |
MICRON MEMORY JAPAN G K |
1990.0 kg |
070920
|
001 15-3AMAT ADVTG2 PEN3VCENTURA AP ADVANTEDGE G2 ACAPK6UJ00 . . |
2021-11-19 |
KLLMJP1081915 |
MICRON MEMORY JAPAN G K |
2000.0 kg |
070920
|
001 15-3AMAT ADVTG2 PEN3VCENTURA AP ADVANTEDGE G2 ACAPK6UJ00 . . |
2021-11-14 |
KLLMJP1081914 |
MICRON MEMORY JAPAN G K |
5540.0 kg |
070920
|
001 15-3AMAT ADVTG2 PEN3VCENTURA AP ADVANTEDGE G2 ACAPK6UJ00 . . |
2021-08-28 |
KLLMNYC202107001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
7882.0 kg |
|
TEL INDY, MICAP 1216085, E0257 TEL INDY, MICAP 1216085, E0257 |
2021-07-19 |
KLLMNYC202106001 |
MICRON SEMICONDUCTOR ASIA PTE LTD |
13586.0 kg |
|
WET_TEL_TW WET_TEL_TW WET_TEL_TW WET_TEL_TW |
2021-06-23 |
KLLMJP1074819 |
MICRON MEMORY JAPAN G K |
2340.0 kg |
701790
|
001 DUALBEAM(SEM,FIB)ELECTRON MICROSCOPE . . . |